DAC
2004
ACM
13 years 11 months ago
2004
ACM
This paper presents new technology that accelerates system verification. Traditional methods for verifying functional designs are based on logic simulation, which becomes more tim...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
Random test generators are often used to create regression suites on-the-fly. Regression suites are commonly generated by choosing several specifications and generating a number o...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
In a CMOS combinational logic circuit, the subthreshold leakage current in the standby state depends on the state of the inputs. In this paper we present a new approach to identif...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
The high leakage current in nano-meter regimes is becoming a significant portion of power dissipation in CMOS circuits as threshold voltage, channel length, and gate oxide thickne...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
There is an increased dominance of intra-die process variations, creating a need for an accurate and fast statistical timing analysis. Most of the recent proposed approaches assum...
APCSAC
2004
IEEE
13 years 11 months ago
2004
IEEE
Abstract. While the fetch unit has been identified as one of the major bottlenecks of Simultaneous Multithreading architecture, several fetch schemes were proposed by prior works t...
APCSAC
2004
IEEE
13 years 11 months ago
2004
IEEE
APCSAC
2004
IEEE
13 years 11 months ago
2004
IEEE
APCSAC
2004
IEEE
13 years 11 months ago
2004
IEEE
The RAMpage hierarchy moves main memory up a level to replace the lowest-level cache by an equivalent-sized SRAM main memory. This paper is a first look at the value of RAMpage to ...
APCSAC
2004
IEEE
13 years 11 months ago
2004
IEEE
As device sizes continue shrinking, lower charges are needed to activate gates, and consequently ever smaller external events (such as single ionizing particles of naturally occurr...