DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
We propose the notion of logical reliability for real-time program tasks that interact through periodically updated program variables. We describe a reliability analysis that chec...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
In the absence of a single module interface standard, integration of pre-designed modules in System-on-Chip design often requires the use of protocol converters. Existing approach...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
Abstract—Embedded system secondary storage size is often constrained, yet storage demands are growing as a result of increasing application complexity and storage of personal dat...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
This paper proposes an efficient method to find the worst case of voltage violation by multi-domain clock gating in an on-chip power network. We first present a voltage response i...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
Microcontrollers are the core part of automotive Electronic Control Units (ECUs). A significant investment of the ECU manufacturers and even their customers is linked to the speci...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
One of the upcoming challenges in embedded processing is to incorporate an increasing amount of adaptivity in order to respond to the multifarious constraints induced by today’s...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
Cache-Content-Duplication (CCD) occurs when there is a miss for a block in a cache and the entire content of the missed block is already in the cache in a block with a different t...