DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
This paper presents an improved hardware structure for the computation of the Whirlpool hash function. By merging the round key computation with the data compression and by using ...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
Accurate power and performance figures are critical to assess the effective design of possible sensor node architectures in Body Area Networks (BANs) since they operate on limite...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
— A design-oriented periodic steady-state analysis is presented in this paper. The new analysis finds the values of circuit parameters that result in a desired circuit performan...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
As semiconductor manufacturing requires greater capital investments, the use of contract foundries has grown dramatically, increasing exposure to mask theft and unauthorized exces...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
A generic and retargetable tool flow is presented that enables the export of timing data from software running on a cycle-accurate Virtual Prototype (VP) to a concurrent function...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
We expect that in future commodity hardware will be used in safety critical applications. But the used commodity microprocessors will become less reliable because of decreasing fe...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
The wiring effort and thus, the routability of electronic designs such as printed circuit boards, multi chip modules and single chip modules largely depends on the assignment of s...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...