DATE
2009
IEEE
14 years 8 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
DATE
2009
IEEE
14 years 8 months ago
2009
IEEE
— Today's innovations in the automotive sector are, to a great extent, based on electronics. The increasing integration complexity and stringent cost reduction goals turn E/...
DATE
2009
IEEE
14 years 8 months ago
2009
IEEE
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
DATE
2009
IEEE
14 years 8 months ago
2009
IEEE
DATE
2009
IEEE
14 years 8 months ago
2009
IEEE
DATE
2009
IEEE
14 years 8 months ago
2009
IEEE
—This paper presents a tool for exploring different parallelization options for an application. It can be used to quickly find a high-quality match between an application and a ...
DATE
2009
IEEE
14 years 8 months ago
2009
IEEE
—This paper presents a new two-levels page-based memory bus protection scheme. A trusted Operating System drives a hardware cryptographic unit and manages security contexts for e...
DATE
2009
IEEE
14 years 8 months ago
2009
IEEE
— Fault injection has become a very classical method to determine the dependability of an integrated system with respect to soft errors. Due to the huge number of possible error ...
DATE
2009
IEEE
14 years 8 months ago
2009
IEEE
—Redundancy Addition and Removal (RAR) is a restructuring technique used in the synthesis and optimization of logic designs. It can remove an existing target wire and add an alte...
DATE
2009
IEEE
14 years 8 months ago
2009
IEEE
In this work, the focus is put on the behavior of a system in case a fault occurs that disables the system from executing its applications. Instead of executing a random subset of...