ICCAD
1991
IEEE
14 years 4 days ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
ICCAD
1991
IEEE
14 years 4 days ago
1991
IEEE
The program TRANALYZE generates a gate-level representation of an MOS transistor circuit. The resulting model contains only four-valued unit and zero delay logic primitives, suita...
ICCAD
1991
IEEE
14 years 4 days ago
1991
IEEE
In a high level synthesis environment there is a strong need for flexible module generators. For the generation of regular structures efficient dedicated module generators can be ...
FACS
1991
14 years 4 days ago
1991
The analysis and measurement of current levels of software reuse are necessary to monitor improvements. This paper provides a framework for the derivation of measures of software ...
CAV
1994
Springer
14 years 4 days ago
1994
Springer
CAV
1991
Springer
14 years 4 days ago
1991
Springer
VTS
1995
IEEE
14 years 4 days ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
VTS
1995
IEEE
14 years 4 days ago
1995
IEEE
In this paper, we propose an entirely new Built-In Self Test scheme for high-level synthesis of data path architectures that makes use of the arithmetic blocks in the data path to...
VTS
1995
IEEE
14 years 4 days ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
VTS
1995
IEEE
14 years 4 days ago
1995
IEEE
To ensure the production of reliable circuits and fully testable unpackaged dies for MCMs burn-in, both dynamic and monitored, remains a feasible option. During this burn-in proce...