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ICCD
1995
IEEE
83views Hardware» more  ICCD 1995»
14 years 5 days ago
Concurrent timing optimization of latch-based digital systems
Many design techniques have been proposed to optimize the performance of a digital system implemented in a given technology. Each of these techniques can be advantageous in partic...
Hong-Yean Hsieh, Wentai Liu, Ralph K. Cavin III, C...
ICCD
1995
IEEE
51views Hardware» more  ICCD 1995»
14 years 5 days ago
Implementing a STARI chip
STARI is a high-speed signaling technique that uses both synchronous and self-timed circuits. To demonstrate STARI, a chip has been fabricated using the MOSIS 2 CMOS process. In a...
Mark R. Greenstreet
ICCD
1995
IEEE
109views Hardware» more  ICCD 1995»
14 years 5 days ago
Verifying the performance of the PCI local bus using symbolic techniques
Symbolic model checking is a successful technique for checking properties of large finite-state systems. This method has been used to verify a number of real-world hardware desig...
Sérgio Vale Aguiar Campos, Edmund M. Clarke...
ICCAD
1995
IEEE
77views Hardware» more  ICCAD 1995»
14 years 5 days ago
PARAS: system-level concurrent partitioning and scheduling
Partitioning for the ASIC designs is examined and the interaction between high-level synthesis and partitioning is studied and incorporated in the solution. Four algorithms (calle...
Wing Hang Wong, Rajiv Jain
ICCAD
1995
IEEE
129views Hardware» more  ICCAD 1995»
14 years 5 days ago
Activity-driven clock design for low power circuits
In this paper we investigate activity-driven clock trees to reduce the dynamic power consumption of synchronous digital CMOS circuits. Sections of an activity-driven clock tree ca...
Gustavo E. Téllez, Amir H. Farrahi, Majid S...
ICCAD
1995
IEEE
96views Hardware» more  ICCAD 1995»
14 years 5 days ago
Delay optimal partitioning targeting low power VLSI circuits
Hirendu Vaishnav, Massoud Pedram
ICCAD
1995
IEEE
94views Hardware» more  ICCAD 1995»
14 years 5 days ago
Test register insertion with minimum hardware cost
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
Albrecht P. Stroele, Hans-Joachim Wunderlich