ITC
1989
IEEE
14 years 23 days ago
1989
IEEE
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
ITC
1989
IEEE
14 years 23 days ago
1989
IEEE
ITC
1989
IEEE
14 years 23 days ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
ITC
1989
IEEE
14 years 23 days ago
1989
IEEE
ISCA
1989
IEEE
14 years 23 days ago
1989
IEEE
ISCA
1989
IEEE
14 years 23 days ago
1989
IEEE
: We explore the question: “What can a von Neumann processor borrow from dataflow to make it more suitable for a multiprocessor?’’ Starting with a simple, “RISC-like” ins...
ISCA
1989
IEEE
14 years 23 days ago
1989
IEEE
ISCA
1989
IEEE
14 years 23 days ago
1989
IEEE
Pipelining has become a common technique to increase throughput of the instruction fetch, instruction decode, and instruction execution portions of modern computers. Branch instru...
ISCA
1989
IEEE
14 years 23 days ago
1989
IEEE
Most current single-chip processors employ an on-chip instruction cache to improve performance. A miss in this insk-uction cache will cause an external memory reference which must...
ICCAD
1990
IEEE
14 years 23 days ago
1990
IEEE
