Sciweavers

MICRO
1992
IEEE
124views Hardware» more  MICRO 1992»
14 years 23 days ago
A shape matching approach for scheduling fine-grained parallelism
- We present a compilation technique for scheduling parallelism on fine grained asynchronous MIMD systems. The shape scheduling algorithm is introduced that utilizes the flexibilit...
Brian A. Malloy, Rajiv Gupta, Mary Lou Soffa
MICRO
1992
IEEE
99views Hardware» more  MICRO 1992»
14 years 23 days ago
An investigation of the performance of various dynamic scheduling techniques
An important design decision in the implementation of a superscalar processor is the amount of hardware to allocate to the instruction scheduling mechanism. Dynamic scheduling pro...
Michael Butler, Yale N. Patt
IWMM
1992
Springer
77views Hardware» more  IWMM 1992»
14 years 23 days ago
Uniprocessor Garbage Collection Techniques
Paul R. Wilson
IWMM
1992
Springer
100views Hardware» more  IWMM 1992»
14 years 23 days ago
Scalable Distributed Garbage Collection for Systems of Active Objects
Abstract. Automatic storage management is important in highly parallel programming environments where large numbers of objects and processes are being constantly created and discar...
Nalini Venkatasubramanian, Gul Agha, Carolyn L. Ta...
IWMM
1992
Springer
138views Hardware» more  IWMM 1992»
14 years 23 days ago
Incremental Collection of Mature Objects
Abstract. We present a garbage collection algorithm that extends generational scavenging to collect large older generations (mature objects) non-disruptively. The algorithm's ...
Richard L. Hudson, J. Eliot B. Moss
IWMM
1992
Springer
85views Hardware» more  IWMM 1992»
14 years 23 days ago
An Implementation of an Applicative File System
A purely functional le system has been built on top of pure Scheme. It provides persistent structures and massive storage expected of le systems, without explicit side-e ects like ...
Brian C. Heck, David S. Wise
ITC
1992
IEEE
90views Hardware» more  ITC 1992»
14 years 23 days ago
ScanBIST: A Multi-frequency Scan-based BIST Method
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies. The technique is used to improve performance testing...
Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hass...
ITC
1992
IEEE
76views Hardware» more  ITC 1992»
14 years 23 days ago
A Small Test Generator for Large Designs
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
Sandip Kundu, Leendert M. Huisman, Indira Nair, Vi...