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    ITC
    2002
    IEEE
    77views Hardware» more  ITC 2002»
    Signal Integrity Loss in SoC's Interconnects: A Diagnosis Approach Using Embedded Microprocessor
    14 years 1 months ago
    Signal Integrity Loss in SoC's Interconnects: A Diagnosis Approach Using Embedded Microprocessor
    Download  www.utdallas.edu
    Mohammad H. Tehranipour, Mehrdad Nourani
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    ITC
    2002
    IEEE
    143views Hardware» more  ITC 2002»
    BIST-Based Diagnosis of FPGA Interconnect
    14 years 1 months ago
    BIST-Based Diagnosis of FPGA Interconnect
    Download  www.eng.auburn.edu
    : We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either...
    Charles E. Stroud, Jeremy Nall, Matthew Lashinsky,...
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    ITC
    2002
    IEEE
    127views Hardware» more  ITC 2002»
    A New Test Generation Approach for Embedded Analogue Cores in SoC
    14 years 1 months ago
    A New Test Generation Approach for Embedded Analogue Cores in SoC
    Download  doc.utwente.nl
    M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. T...
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    ITC
    2002
    IEEE
    114views Hardware» more  ITC 2002»
    Scan Power Reduction Through Test Data Transition Frequency Analysis
    14 years 1 months ago
    Scan Power Reduction Through Test Data Transition Frequency Analysis
    Download  cseweb.ucsd.edu
    Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
    Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
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    ITC
    2002
    IEEE
    97views Hardware» more  ITC 2002»
    RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST
    14 years 1 months ago
    RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST
    Download  dit.upc.es
    Marcelino B. Santos, Isabel C. Teixeira, Joã...
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    ITC
    2002
    IEEE
    88views Hardware» more  ITC 2002»
    Embedded Deterministic Test for Low-Cost Manufacturing Test
    14 years 1 months ago
    Embedded Deterministic Test for Low-Cost Manufacturing Test
    Download  www.itcprogramdev.org
    Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan...
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    ITC
    2002
    IEEE
    98views Hardware» more  ITC 2002»
    A New Algorithm for Global Fault Collapsing into Equivalence and Dominance Sets
    14 years 1 months ago
    A New Algorithm for Global Fault Collapsing into Equivalence and Dominance Sets
    Download  www.eng.auburn.edu
    A. V. S. S. Prasad, Vishwani D. Agrawal, Madhusuda...
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    ITC
    2002
    IEEE
    84views Hardware» more  ITC 2002»
    Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems
    14 years 1 months ago
    Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems
    Download  mtv.ece.ucsb.edu
    Ganapathy Parthasarathy, Madhu K. Iyer, Tao Feng, ...
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    ITC
    2002
    IEEE
    97views Hardware» more  ITC 2002»
    A Multi-Language Goal-Tree Based Functional Test Planning System
    14 years 1 months ago
    A Multi-Language Goal-Tree Based Functional Test Planning System
    Download  scholar.lib.vt.edu
    Rajneesh Mahajan, Ramesh Govindarajulu, J. R. Arms...
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    ITC
    2002
    IEEE
    80views Hardware» more  ITC 2002»
    Screening MinVDD Outliers Using Feed-Forward Voltage Testing
    14 years 1 months ago
    Screening MinVDD Outliers Using Feed-Forward Voltage Testing
    Download  www.itcprogramdev.org
    Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchi...
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