: We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either...
Charles E. Stroud, Jeremy Nall, Matthew Lashinsky,...
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...