A new methodology for designing logic circuits with partial error masking is described. The key idea is to exploit the asymmetric soft error susceptibility of nodes in a logic cir...
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
A new hybrid BIST scheme is proposed which is based on using an “incrementally guided LFSR.” It very efficiently combines external deterministic data from the tester with on-c...
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...
Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, ...
This paper discusses a hybrid optoelectronic scheme for a new interconnection network, "Tori connected mESHes (TESH)". The major features of TESH are the following: it i...
Over the last years, an increasing number of safety-critical tasks have been demanded to computer systems. In this paper, a software-based approach for developing safety-critical
O. Goloubeva, Maurizio Rebaudengo, Matteo Sonza Re...
This paper proposes a new fault model and its modeling and analysis methods in a clockless asynchronous wave pipeline for extensive yield evaluation and assurance. It is highly de...
T. Feng, Nohpill Park, Yong-Bin Kim, Vincenzo Piur...
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Che...