With growing computational needs of many real-world applications, frequently changing specifications of standards, and the high design and NRE costs of ASICs, an algorithm-agile ...
Ramachandran Pradeep, S. Vinay, Sanjay Burman, V. ...
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI ...
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...
: - One of the main bottlenecks when designing a network processing system is very often its memory subsystem. This is mainly due to the state-of-the-art network links operating at...
Ioannis Papaefstathiou, Theofanis Orphanoudakis, G...
As compared to a large spectrum of performance optimizations, relatively little effort has been dedicated to optimize other aspects of embedded applications such as memory space r...
Ozcan Ozturk, Hendra Saputra, Mahmut T. Kandemir, ...
Main memories can consume a large percentage of overall energy in many data-intensive embedded applications. The past research proposed and evaluated memory banking as a possible ...
In this paper, we present a methodology for customized communication architecture synthesis that matches the communication requirements of the target application. This is an impor...