DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper tackles the problem of dynamic power management (DPM) in nanoscale CMOS design technologies that are typically affected by increasing levels of process, voltage, and te...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
In deep submicron circuits, elevation in temperatures has brought new challenges in reliability, timing, performance, cooling costs and leakage power. Conventional thermal managem...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Reliability of logic circuits is emerging as an important concern that may limit the benefits of continued scaling of process technology and the emergence of future technology al...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Due to the widespread demands for efficient SAT solvers in Electronic Design Automation applications, methods to boost the performance of the SAT solver are highly desired. We pr...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clock...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Low energy consumption and load balancing are required for enhancing lifetime at Wireless Sensor Networks (WSN). In addition, network dynamics and different delay, throughput, and...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
1 Developing modern integrated and embedded systems require well-designed processes to ensure flexibility and independency. These features are related to exchangeability of hardw...