ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
We proposed a combined magnetic and circuit level technique to explore the design methodology of SpinTorque Transfer RAM (SPRAM). A dynamic magnetic model of magnetic tunneling ju...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
— Designers require variational information for robust designs. Characterization of such information can be costly for the novel nanoparticle interconnect process, which utilize ...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
– As silicon technology scales, we can integrate more and more circuits on a single chip, which means more I/Os are needed in modern designs. The flip-chip technology which was ...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
We propose a novel dependable SRAM with 7T memory cells, and introduce a new concept, “quality of a bit (QoB)” for it. The proposed SRAM has three modes: a typical mode, high-...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
In this paper dual-K (DKCMOS) technology is proposed as a method for gate leakage power reduction. An integer linear programming (ILP) based algorithm is proposed for its optimiza...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
In multi-core processors there are several ways to pair a thread to a particular core. These load-balancing techniques result in a quite different power, performance and thermal b...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
SRAM leakage power dominates the total power of low duty-cycle applications, e.g., sensor nodes. Accordingly, leakage power reduction during data-retention in SRAM standby is ofte...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
Correct input/output behavior of circuits in presence of internal malfunctions becomes more and more important. But reliable and efficient methods to measure this robustness are ...