ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
—The technique of module-threading utilizes standard DDR DRAM components to build modified memory modules. These modified modules incorporate one or more additional control signa...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
—Field-Programmable Gate Array (FPGA) technology is characterized by continuous improvements that provide new opportunities in system design. Multiprocessors-ona-Programmable-Chi...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
Pointer bugs associated with dynamically-allocated objects resulting in out-of-bounds memory access are an important class of software bugs. Because such bugs cannot be detected e...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
This paper presents a new scheduling technique to improve the speed, power, and scalability of a dynamic scheduler. In a high-performance superscalar processor, the instruction sc...