ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
The purpose of this work is to explore how device operation parameters such as switching speed and power dissipation scale with voltage and temperature. We simulated a CMOS ring o...
ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
As technology scales down, power supply noise is becoming a performance and reliability bottleneck in modern VLSI. We propose a power supply noise-aware design methodology for hig...
ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
This paper proposes an efficient automation platform that provides fast and reliable path to analog circuit design for desired specifications. Circuit heuristics and hierarchy a...
ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
Multi-project wafer having several chips placed on the same reticle to lower mask cost is key to low-volume IC fabrication. In this paper1 , we proposed two MILP models for simult...
ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
In this work, we present a genetic algorithm based thermal-aware floorplanning framework that aims at reducing hot spots and distributing temperature evenly across a chip while op...
ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract— Reliability enhancements are traditionally implemented through redundancies at the system level or through the use of harden-cell-designs at the circuit level. Reliabil...
ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract - This paper studies design considerations for lowpower ultra wideband (UWB) receiver architectures. First, three different architectures for the impulse-radio UWB transce...
ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
As the scale and complexity of VLSI circuits increase, Electronic Design Automation (EDA) tools become much more sophisticated and are held to increasing standards of quality. New...