ACSD
2010
IEEE
13 years 9 months ago
2010
IEEE
Digital components play a central role in the design of complex embedded systems. These components are interconnected with other, possibly analog, devices and the physical environm...
ISLPED
2000
ACM
14 years 2 months ago
2000
ACM
This paper presents a state assignment technique called priority encoding which uses multi-code assignment plus clock gating to reduce power dissipation in sequential circuits. Th...
ICCAD
1996
IEEE
14 years 3 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
ICCD
1997
IEEE
14 years 3 months ago
1997
IEEE
Abstract— In this paper we consider the problem of clustering sequential circuits subject to a bound on the area of each cluster, with the objective of minimizing the clock perio...
DATE
1999
IEEE
14 years 3 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
ATS
2000
IEEE
14 years 3 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
EH
2002
IEEE
14 years 4 months ago
2002
IEEE
Evolutionary algorithms (EAs) are regularly used both for the solution of scheduling problems, and for the creation of digital circuit designs. This paper describes a unified app...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
In this paper, we propose a novel technique on mining relationships in a sequential circuit to discover global constraints. In contrast to the traditional learning methods, our mi...
DFT
2007
IEEE
14 years 5 months ago
2007
IEEE
The paper discusses a novel approach for reduction of fault detection latency in a selfchecking sequential circuit. The Authors propose decomposing the finite state machine (FSM) ...
DATE
2007
IEEE
14 years 5 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...