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ASPLOS
2010
ACM
14 years 6 months ago
Shoestring: probabilistic soft error reliability on the cheap
Aggressive technology scaling provides designers with an ever increasing budget of cheaper and faster transistors. Unfortunately, this trend is accompanied by a decline in individ...
Shuguang Feng, Shantanu Gupta, Amin Ansari, Scott ...
ICCAD
2004
IEEE
85views Hardware» more  ICCAD 2004»
14 years 8 months ago
Improving soft-error tolerance of FPGA configuration bits
Soft errors that change configuration bits of an SRAM based FPGA modify the functionality of the design. The proliferation of FPGA devices in various critical applications makes it...
Suresh Srinivasan, Aman Gayasen, Narayanan Vijaykr...
ICCD
2008
IEEE
157views Hardware» more  ICCD 2008»
14 years 8 months ago
Power-aware soft error hardening via selective voltage scaling
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
Kai-Chiang Wu, Diana Marculescu
VLSID
2008
IEEE
117views VLSI» more  VLSID 2008»
15 years 14 hour ago
Single Event Upset: An Embedded Tutorial
Abstract-- With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends su...
Fan Wang, Vishwani D. Agrawal