IOLTS
2005
IEEE
14 years 5 months ago
2005
IEEE
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on ...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
In this work, we experiment with complier-directed instruction duplication to detect soft errors in VLIW datapaths . In the proposed approach, the compiler determines the instruct...
ASPDAC
2006
ACM
14 years 5 months ago
2006
ACM
— Soft errors are becoming a common problem in current systems due to the scaling of technology that results in the use of smaller devices, lower voltages, and power-saving techn...
PRDC
2006
IEEE
14 years 5 months ago
2006
IEEE
As SRAM devices are scaled down, the number of variation-induced defective memory cells increases rapidly. Combination of ECC, particularly SECDED, with a redundancy technique can...
ISQED
2006
IEEE
14 years 5 months ago
2006
IEEE
This paper proposes a simulation-based soft error estimation methodology for computer systems. Accumulating soft error rates (SERs) of all memories in a computer system results in...
IOLTS
2006
IEEE
14 years 5 months ago
2006
IEEE
A significant fraction of soft errors in modern microprocessors has been reported to never lead to a system failure. Any concurrent error detection scheme that raises alarm every ...
IISWC
2006
IEEE
14 years 5 months ago
2006
IEEE
Soft errors have become a significant concern and recent studies have measured the “architectural vulnerability factor” of systems to such errors, or conversely, the potentia...
DFT
2006
IEEE
14 years 5 months ago
2006
IEEE
Image processing systems are increasingly used in safetycritical applications, and their hardening against soft errors becomes an issue. We propose a methodology to identify soft ...