DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
DATE
2010
IEEE
14 years 17 days ago
2010
IEEE
Adaptive testing is a generic term for a number of techniques which aim at improving the test quality and/or reducing the test application costs. In adaptive tests, the test conte...
ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
VLSI
2005
Springer
14 years 29 days ago
2005
Springer
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...