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In nanometer scaled CMOS devices significant increase in the subthreshold, the gate and the reverse biased junction band-toband-tunneling (BTBT) leakage, results in the large incr...
Traditionally, at early design stages, leakage power is associated with the number of transistors in a design. Hence, intuitively an implementation with minimum resource usage wou...
Abstract— This paper quantifies the impact of threshold voltage variation on aging-related hard failure rates in a highperformance 65nm processor. Simulations show that threshol...
Brian Greskamp, Smruti R. Sarangi, Josep Torrellas
— This paper revisits and extends a general linear programming(LP) formulation to exploit multiple knobs such as multi-Lgate footprint-compatible libraries and post-layout Lgateb...
If current technology scaling trends hold, leakage power dissipation will soon become the dominant source of power consumption in high performance processors. Caches, due to the f...