DAC
2011
ACM
13 years 10 days ago
2011
ACM
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...
ETS
2010
IEEE
13 years 11 months ago
2010
IEEE
ÑIn this paper, we present a comparative study on the effects of resistive-bridging defects in the SRAM core-cells, considering different technology nodes. In particular, we analy...
ASPDAC
2008
ACM
14 years 2 months ago
2008
ACM
ACT Benchmarks are an immensely useful tool in performing research since they allow for rapid and clear comparison between different approaches to solving CAD problems. Recent expe...
ASPDAC
2001
ACM
14 years 4 months ago
2001
ACM
One of the most challenging issues in today's high-performance VLSI design is to ensure high-quality power supply to each individual circuit blocks. Reduced power supply volt...
ICES
2001
Springer
14 years 5 months ago
2001
Springer
This paper introduces the concept of polymorphic electronics (polytronics) –referring to electronics with superimposed built-in functionality. A function change does not require ...
ITC
2003
IEEE
14 years 5 months ago
2003
IEEE
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...
ATS
2005
IEEE
14 years 6 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
ISCAS
2006
IEEE
14 years 6 months ago
2006
IEEE
— Violations in the timing constraints of a clocked register can cause a synchronous system to malfunction. The effects of variations in the power supply voltage (VDD) on the tim...
AHS
2006
IEEE
14 years 6 months ago
2006
IEEE
Polymorphic electronics provides a new way for obtaining circuits that are able to perform two or more functions depending on the environment in which they operate. These function...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...