11 search results - page 1 / 3 » Random Access Scan: A solution to test power, test data volu... |
159
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DFT
2002
IEEE
15 years 9 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
124
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VTS
2005
IEEE
15 years 9 months ago
2005
IEEE
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
125
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ISQED
2010
IEEE
15 years 9 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
131
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DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test dat...