The amount of memory being embedded on chip is growing rapidly. This strongly implies that memory Built-in-self-test (BIST) logic assumes utmost importance amongst all on chip sel...
Raja Venkatesh, Sailesh Kumar, Joji Philip, Sunil ...
Abstract. The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric ver...
Vyacheslav N. Yarmolik, I. V. Bykov, Sybille Helle...
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
: It has always been assumed that fault models in memories are sufficiently precise for specifying the faulty behavior. This means that, given a fault model, it should be possible...