1398 search results - page 23 / 280 » Application-Specific Integrated Circuits |
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
This paper demonstrates a system that performs multiobjective sizing across 100,000 analog circuit topologies simultaneously, with SPICE accuracy. It builds on a previous system, ...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
† Noise performance is a critical analog and RF circuit design constraint, and can impact the selection of the IC system-level architecture. It is therefore imperative that some ...
ICCAD
2000
IEEE
14 years 2 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ICCD
2007
IEEE
14 years 7 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
Three-dimensional integrated circuits (3DICs) have the potential to reduce interconnect lengths and improve digital system performance. However, heat removal is more difficult in ...