510 search results - page 48 / 102 » Automated Design of Quantum Circuits |
DAC
2007
ACM
14 years 11 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2002
ACM
14 years 11 months ago
2002
ACM
The ForSyDe methodology has been developed for system level design. In this paper we present formal transformation methods for the refinement of an abstract and formal system mode...
DAC
2004
ACM
14 years 11 months ago
2004
ACM
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
DAC
2004
ACM
14 years 11 months ago
2004
ACM
This paper shows a method to decompose a given multipleoutput circuit into two circuits with intermediate outputs. We use a BDD for characteristic function (BDD for CF) to represe...
DAC
2003
ACM
14 years 11 months ago
2003
ACM
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...