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ISQED
2005
IEEE
76views Hardware» more  ISQED 2005»
14 years 1 months ago
Technology Mapping for Reliability Enhancement in Logic Synthesis
Abstract— Reliability enhancements are traditionally implemented through redundancies at the system level or through the use of harden-cell-designs at the circuit level. Reliabil...
Zhaojun Wo, Israel Koren
DATE
2003
IEEE
116views Hardware» more  DATE 2003»
14 years 1 months ago
Statistical Timing Analysis Using Bounds
The growing impact of within-die process variation has created the need for statistical timing analysis, where gate delays are modeled as random variables. Statistical timing anal...
Aseem Agarwal, David Blaauw, Vladimir Zolotov, Sar...
DFT
2003
IEEE
113views VLSI» more  DFT 2003»
14 years 1 months ago
Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
ICCAD
2003
IEEE
205views Hardware» more  ICCAD 2003»
14 years 1 months ago
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
Aseem Agarwal, David Blaauw, Vladimir Zolotov
DATE
2010
IEEE
165views Hardware» more  DATE 2010»
14 years 24 days ago
Multicore soft error rate stabilization using adaptive dual modular redundancy
— The use of dynamic voltage and frequency scaling (DVFS) in contemporary multicores provides significant protection from unpredictable thermal events. A side effect of DVFS can ...
Ramakrishna Vadlamani, Jia Zhao, Wayne P. Burleson...