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    DAC
    2003
    ACM
    127views Computer Architecture» more  DAC 2003»
    Statistical timing for parametric yield prediction of digital integrated circuits
    16 years 5 months ago
    Statistical timing for parametric yield prediction of digital integrated circuits
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    Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, ...
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    DAC
    2004
    ACM
    101views Computer Architecture» more  DAC 2004»
    A synthesis flow toward fast parasitic closure for radio-frequency integrated circuits
    16 years 5 months ago
    A synthesis flow toward fast parasitic closure for radio-frequency integrated circuits
    Download  www.cdnusers.org
    Gang Zhang, E. Aykut Dengi, Ronald A. Rohrer, Rob ...
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    VLSID
    2005
    IEEE
    153views VLSI» more  VLSID 2005»
    Electromigration-Aware Physical Design of Integrated Circuits
    16 years 4 months ago
    Electromigration-Aware Physical Design of Integrated Circuits
    Download  www.tu-dresden.de
    The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
    Göran Jerke, Jens Lienig
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    ICCAD
    2001
    IEEE
    77views Hardware» more  ICCAD 2001»
    Practical Considerations in RLCK Crosstalk Analysis for Digital Integrated Circuits
    16 years 1 months ago
    Practical Considerations in RLCK Crosstalk Analysis for Digital Integrated Circuits
    Download  www.cisl.columbia.edu
    Steven C. Chan, Kenneth L. Shepard
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    3DIC
    2009
    IEEE
    138views Hardware» more  3DIC 2009»
    Wafer-scale 3D integration of InGaAs image sensors with Si readout circuits
    15 years 11 months ago
    Wafer-scale 3D integration of InGaAs image sensors with Si readout circuits
    Download  www.soiconsortium.org
    Chang-Lee Chen, D.-R. Yost, Jeffrey M. Knecht, Dav...
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