253 search results - page 37 / 51 » Circuit partitions and |
ETS
2006
IEEE
14 years 3 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
ICCAD
2006
IEEE
14 years 3 months ago
2006
IEEE
Abstract—Power/ground noise is a major source of VLSI circuit timing variations. This work aims to reduce clock network induced power noise by assigning different signal polariti...
VTS
2005
IEEE
14 years 2 months ago
2005
IEEE
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...
ASPDAC
2004
ACM
14 years 2 months ago
2004
ACM
- This paper presents a solution to the problem of designing interconnects for memory devices. More precisely, it solves the automatic routing problem of memory peripheral circuits...
DAC
2004
ACM
14 years 2 months ago
2004
ACM
In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feed...