We propose a gate resizing method for delay and power optimization that is based on statistical static timing analysis. Our method focuses on the component of timing uncertainties...
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...
Abstract--In this paper, we present a new approach to calculate the steady state resistance values for CMOS library gates. These resistances are defined as simple equivalent models...
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...