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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
14 years 7 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
SIGMETRICS
2008
ACM
121views Hardware» more  SIGMETRICS 2008»
13 years 6 months ago
Disk scrubbing versus intra-disk redundancy for high-reliability raid storage systems
Two schemes proposed to cope with unrecoverable or latent media errors and enhance the reliability of RAID systems are examined. The first scheme is the established, widely used d...
Ilias Iliadis, Robert Haas, Xiao-Yu Hu, Evangelos ...
DEPCOS
2008
IEEE
180views Hardware» more  DEPCOS 2008»
14 years 1 months ago
A Resilient SIL 2 Driver Machine Interface for Train Control Systems
In railway train-borne equipment, the Driver Machine Interface (DMI) acts like a bridge between the train driver and the onboard automatic train control system (European Vital Com...
Andrea Ceccarelli, István Majzik, Danilo Io...
VTS
2005
IEEE
95views Hardware» more  VTS 2005»
14 years 9 days ago
SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
Baosheng Wang, Yuejian Wu, Josh Yang, André...
ESOP
2003
Springer
13 years 12 months ago
Modeling Web Interactions
Programmers confront a minefield when they design interactive Web programs. Web interactions take place via Web browsers. With browsers, consumers can whimsically navigate among t...
Paul T. Graunke, Robert Bruce Findler, Shriram Kri...