In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Two schemes proposed to cope with unrecoverable or latent media errors and enhance the reliability of RAID systems are examined. The first scheme is the established, widely used d...
Ilias Iliadis, Robert Haas, Xiao-Yu Hu, Evangelos ...
In railway train-borne equipment, the Driver Machine Interface (DMI) acts like a bridge between the train driver and the onboard automatic train control system (European Vital Com...
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
Programmers confront a minefield when they design interactive Web programs. Web interactions take place via Web browsers. With browsers, consumers can whimsically navigate among t...
Paul T. Graunke, Robert Bruce Findler, Shriram Kri...