787 search results - page 65 / 158 » Digital Algebra and Circuits |
DFT
2004
IEEE
14 years 23 days ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
This paper presents the design and the laboratory results of an integrated half-bridge driver for power electronic systems in a 0.35 µm Bipolar CMOS DMOS (BCD) technology. The pr...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
With reference to digital input power amplifier for automotive audio applications, the paper presents an exhaustive exploration of the huge mixed-signal space to find optimal trad...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
ISCAS
1999
IEEE
14 years 1 months ago
1999
IEEE
This paper presents the design consideration of high order digital AZ modulators used as modulus controller for fractional-N frequency synthesizer. A third-order MASH structure (M...