In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
This paper presents the design and the laboratory results of an integrated half-bridge driver for power electronic systems in a 0.35 µm Bipolar CMOS DMOS (BCD) technology. The pr...
Francesco D'Ascoli, Luca Bacciarelli, Massimiliano...
With reference to digital input power amplifier for automotive audio applications, the paper presents an exhaustive exploration of the huge mixed-signal space to find optimal trad...
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
This paper presents the design consideration of high order digital AZ modulators used as modulus controller for fractional-N frequency synthesizer. A third-order MASH structure (M...