The interconnection network consumes the majority of die area in an FPGA. Presented is a scalable manufacturing test method for all SRAM-based FPGAs, able to detect multiple inter...
Conventional fault simulation techniques for FPGAs are very complicated and time consuming. The other alternative, FPGA fault emulation technique, is incomplete, and can be used o...
Mehdi Baradaran Tahoori, Subhasish Mitra, Shahin T...
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...
Adrian Lifa, Petru Eles, Zebo Peng, Viacheslav Izo...