2997 search results - page 395 / 600 » Fuzzy robustness analysis |
ICCAD
1996
IEEE
14 years 2 months ago
1996
IEEE
In this paper, we propose a method to generate high quality test waveform on chip to avoid the parasitic eects in an analog testability bus test environment. For the test response...
ASPDAC
2007
ACM
14 years 2 months ago
2007
ACM
We present a robust, automated oscillator macromodeling technique for extracting comprehensive phase and amplitude macromodels from oscillators' SPICE circuit descriptions. Th...
AUSAI
2007
Springer
14 years 2 months ago
2007
Springer
Many real-world problems are over-constrained and require search techniques adapted to optimising cost functions rather than searching for consistency. This makes the MAX-SAT probl...
VLSID
2010
IEEE
14 years 2 months ago
2010
IEEE
A novel design approach for simultaneous power and stability (static noise margin, SNM) optimization of nanoCMOS static random access memory (SRAM) is presented. A 45nm single-end...
APCCAS
2006
IEEE
14 years 1 months ago
2006
IEEE
A new low offset dynamic comparator for high resolution high speed analog-to-digital application has been designed. Inputs are reconfigured from the typical differential pair compa...