Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...
A new methodology for designing logic circuits with partial error masking is described. The key idea is to exploit the asymmetric soft error susceptibility of nodes in a logic cir...
—Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital systems, which increase exponentially with Moore’s law. The first step in develo...
In this paper, a new paradigm for designing logic circuits with concurrent error detection (CED) is described. The key idea is to exploit the asymmetric soft error susceptibility ...