60 search results - page 1 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
DFT
2008
IEEE
14 years 1 months ago
2008
IEEE
VTS
2005
IEEE
14 years 1 months ago
2005
IEEE
Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...
DFT
2003
IEEE
14 years 23 days ago
2003
IEEE
A new methodology for designing logic circuits with partial error masking is described. The key idea is to exploit the asymmetric soft error susceptibility of nodes in a logic cir...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
—Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital systems, which increase exponentially with Moore’s law. The first step in develo...
ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
In this paper, a new paradigm for designing logic circuits with concurrent error detection (CED) is described. The key idea is to exploit the asymmetric soft error susceptibility ...