66 search results - page 9 / 14 » Optimization of critical paths in circuits with level-sensit... |
TCAD
2008
13 years 7 months ago
2008
Starting at the 65-nm node, stress engineering to improve the performance of transistors has been a major industry focus. An intrinsic stress source--shallow trench isolation (STI)...
ICCAD
2003
IEEE
14 years 25 days ago
2003
IEEE
The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
ICCD
2001
IEEE
14 years 4 months ago
2001
IEEE
Dynamic power is the main source of power consumption in CMOS circuits. It depends on the square of the supply voltage. It may significantly be reduced by scaling down the supply ...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
Custom design, in which the designer controls the physical structure of the chip, can greatly improve the speed, power, and delay of an ASIC chip without affecting design time. Th...