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ISQED
2005
IEEE
91views Hardware» more  ISQED 2005»
14 years 3 months ago
Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning
Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Gh...
DFT
2003
IEEE
81views VLSI» more  DFT 2003»
14 years 3 months ago
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment
Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schia...
DATE
2002
IEEE
98views Hardware» more  DATE 2002»
14 years 2 months ago
Self-Checking Scheme for the On-Line Testing of Power Supply Noise
Cecilia Metra, Luca Schiano, Bruno Riccò, M...
ATS
2000
IEEE
86views Hardware» more  ATS 2000»
14 years 2 months ago
An adjacency-based test pattern generator for low power BIST design
Patrick Girard, Loïs Guiller, Christian Landr...