1419 search results - page 21 / 284 » Power Droop Testing |
PODC
2012
ACM
12 years 8 days ago
2012
ACM
In recent years, there have been a few proposals to add a small amount of trusted hardware at each replica in a Byzantine fault tolerant system to cut back replication factors. Th...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This work discusses the impact of power consumption on the test time of core-based systems, when an available on-chip network is reused as test access mechanism. A previously prop...
DATE
2010
IEEE
14 years 8 days ago
2010
IEEE
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
ITC
2000
IEEE
14 years 2 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
—More and more processor manufacturers have launched embedded multicore processors for consumer electronics products because such processors provide high performance and low powe...