Due to larger buses (length, width) and deep sub-micron effects where coupling capacitances between bus lines are in the same order of magnitude as base capacitances, power consum...
- Dynamic power consumption in CMOS circuits is usually estimated based on the number of signal transitions. However, when considering glitches, this is not accurate because narrow...
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael ...
Capacitance coupling can have a significant impact on gate delay in today's deep submicron circuits. In this paper we present a static timing analysis tool that calculates th...
Realization of high-performance domino logic depends strongly on energy-efficient and noise-tolerant interconnect design in ultra deep sub-micron processes. We characterize the c...
Ki-Wook Kim, Seong-Ook Jung, Unni Narayanan, C. L....