129 search results - page 15 / 26 » Process Variations and their Impact on Circuit Operation |
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Carbon Nanotube Field-Effect Transistors (CNFETs) show big promise as extensions to silicon-CMOS because: 1) Ideal CNFETs can provide significant energy and performance benefits o...
ITC
2003
IEEE
14 years 19 days ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
An energy optimization is proposed that addresses the nontrivial digital contribution to power and impact on performance in high-speed mixed-signal circuits. Parallel energy and b...