29 search results - page 4 / 6 » Resistive Bridging Fault Simulation of Industrial Circuits |
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
This paper presents a concurrent error detection technique targeted towards control logic in a processor with emphasis on low area overhead. Rather than detect all modeled transie...
VLSID
2004
IEEE
14 years 10 months ago
2004
IEEE
Abstract--In this paper, we present a new approach to calculate the steady state resistance values for CMOS library gates. These resistances are defined as simple equivalent models...
VTS
2006
IEEE
14 years 3 months ago
2006
IEEE
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
ATS
2009
IEEE
14 years 4 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...