With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...
In this paper we explain the steps of the CAD tools developed for self checking circuits. The CAD tools developed are used to design Strongly Fault Secure, Strongly Code Disjoint ...
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
This paper describes an efficient implementation of an effective sequential synthesis operation that uses induction to detect and merge sequentially-equivalent nodes. State-encodi...
Alan Mishchenko, Michael L. Case, Robert K. Brayto...
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Salu...