768 search results - page 41 / 154 » Robustness of Sequential Circuits |
ISQED
2009
IEEE
14 years 3 months ago
2009
IEEE
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...
EURODAC
1994
IEEE
14 years 1 months ago
1994
IEEE
In this paper we explain the steps of the CAD tools developed for self checking circuits. The CAD tools developed are used to design Strongly Fault Secure, Strongly Code Disjoint ...
DAC
1997
ACM
14 years 1 months ago
1997
ACM
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
This paper describes an efficient implementation of an effective sequential synthesis operation that uses induction to detect and merge sequentially-equivalent nodes. State-encodi...
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...