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ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
14 years 4 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
ICCAD
2000
IEEE
95views Hardware» more  ICCAD 2000»
14 years 2 months ago
Test of Future System-on-Chips
Spurred by technology leading to the availability of millions of gates per chip, system-level integration is evolving as a new paradigm, allowing entire systems to be built on a s...
Yervant Zorian, Sujit Dey, Mike Rodgers
ICCAD
2002
IEEE
146views Hardware» more  ICCAD 2002»
14 years 6 months ago
Test-model based hierarchical DFT synthesis
With increasing design sizes and adoption of System on a Chip (SoC) methodology, design synthesis and test automation tools are hitting capacity and performance bottlenecks. Curre...
Sanjay Ramnath, Frederic Neuveux, Mokhtar Hirech, ...
DAC
2006
ACM
13 years 11 months ago
Systematic software-based self-test for pipelined processors
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
Mihalis Psarakis, Dimitris Gizopoulos, Miltiadis H...
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
14 years 10 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen