173 search results - page 14 / 35 » Scan Architecture With Align-Encode |
DAC
2003
ACM
14 years 1 months ago
2003
ACM
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
DAC
1999
ACM
14 years 9 months ago
1999
ACM
This paper presents a synthesis tool ICEBERG for embedded in-circuit emulators (ICE's), that are part of the development environment for microcontroller (or microprocessor)-b...
DAC
2004
ACM
14 years 9 days ago
2004
ACM
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
VLSID
2007
IEEE
14 years 9 months ago
2007
IEEE
The Discrete Wavelet Transform (DWT) forms the core of the JPEG2000 image compression algorithm. Since the JPEG2000 compression application is heavily data-intensive, the overall ...
DATE
2004
IEEE
14 years 9 days ago
2004
IEEE
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...