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    DAC
    1999
    ACM
    124views Computer Architecture» more  DAC 1999»
    Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme
    14 years 9 months ago
    Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme
    Download  cadlab.ece.ucsb.edu
    Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik
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    VLSID
    2004
    IEEE
    93views VLSI» more  VLSID 2004»
    Random Access Scan: A solution to test power, test data volume and test time
    14 years 9 months ago
    Random Access Scan: A solution to test power, test data volume and test time
    Download  www.serc.iisc.ernet.in
    Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara
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    VLSID
    2002
    IEEE
    82views VLSI» more  VLSID 2002»
    Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST
    14 years 9 months ago
    Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST
    Download  www.pld.ttu.ee
    Nadir Z. Basturkmen, Sudhakar M. Reddy, Janusz Raj...
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    DAC
    1989
    ACM
    116views Computer Architecture» more  DAC 1989»
    Special Purpose Architecture for Accelerating Bitmap DRC
    14 years 18 days ago
    Special Purpose Architecture for Accelerating Bitmap DRC
    Download  eprints.iisc.ernet.in
    In this paper we propose algorithms for performing DRC on a bitmapped layout altd developspecial purpose architecture for its implementation. we Use window scan method, with flexib...
    Narasimha B. Bhat, S. K. Nandy
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    VLSID
    2005
    IEEE
    131views VLSI» more  VLSID 2005»
    Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
    14 years 9 months ago
    Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
    Download  people.ee.duke.edu
    Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
    Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
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