302 search results - page 7 / 61 » Sequential circuits for program analysis |
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
Abstract— In this paper, we introduce a novel preimage computation technique that directly computes the circuit cofactors without an explicit search for any satisfiable solution...
JAR
2008
13 years 7 months ago
2008
We analyze three proof strategies commonly used in deductive verification of deterministic sequential programs formalized with operational semantics. The strategies are: (i) stepw...
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
| This paper reports the design of BIST structures for sequential machines. Testability of an FSM is limited due to the fact that some machine states remain unreachable and some ac...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...