: Modern SoC Design for high-volume products requires a strong focus on Design-for-Test and Designfor-Manufacturability. We present a case study of an SoC test concept, including a...
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
Current electronic system design requires to be concerned with power consumption consideration. However, in a lot of design tools, the application power consumption budget is esti...