205 search results - page 7 / 41 » SoC Design and Test Considerations |
DSD
2010
IEEE
13 years 7 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
ATS
2010
IEEE
13 years 4 months ago
2010
IEEE
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
APGV
2009
ACM
14 years 1 months ago
2009
ACM
An inadequately designed display viewed in the dark can easily cause dazzling glare and affect our night vision. In this paper we test a display design in which the spectral light...
DAC
2003
ACM
14 years 7 months ago
2003
ACM
Interconnects have been shown to be a dominant source of energy consumption in modern day System-on-Chip (SoC) designs. With a large (and growing) number of electronic systems bei...
ICCD
2005
IEEE
14 years 3 months ago
2005
IEEE
As technology scales, power consumption and thermal effects have become challenges for system-on-chip designers. The rising on-chip temperatures can have negative impacts on SoC p...