10 search results - page 1 / 2 » Statistical timing for parametric yield prediction of digita... |
DAC
2003
ACM
14 years 11 months ago
2003
ACM
DAC
2003
ACM
14 years 11 months ago
2003
ACM
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...
DAC
2004
ACM
14 years 11 months ago
2004
ACM
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
FPGA
2007
ACM
14 years 5 months ago
2007
ACM
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
DAC
2004
ACM
14 years 4 months ago
2004
ACM
Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...