20 search results - page 3 / 4 » Structural In-Field Diagnosis for Random Logic Circuits |
DAC
2005
ACM
14 years 8 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
Circuit fabrics composed of highly regular structures, called logic bricks, have been described recently for improving yield. An automated logic brick design flow based on a SAT ...
KR
2000
Springer
13 years 11 months ago
2000
Springer
In contrast with classical reasoning, where a solution is either correct or incorrect, approximate reasoning tries to compute solutions which are close to the ideal solution, with...
ATS
2003
IEEE
14 years 23 days ago
2003
IEEE
Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of thes...
VLSID
2006
IEEE
14 years 7 months ago
2006
IEEE
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...